COL  ICSD Collection Code 79634
 DATE Recorded Oct 14, 1996
 NAME Silicon oxide
 MINR Quartz
 FORM Si O2
      = O2 Si
 TITL Crystal structures of the low-temperature quartz-type phases of Si 
      O2 and Ge O2 at elevated pressure
 REF  Zeitschrift fuer Kristallographie (149,1979-)
      ZEKRD 198 (1992) 177-212
 AUT  Glinnemann J, KingÿHÿEÿjr, SchulzÿH, HahnÿTh, La PlacaÿSÿJ, DacolÿF
 CELL a=4.921(1) b=4.921(1) c=5.416(1) à=90.0 á=90.0 ç=120.0
      V=113.6 Z=3
 SGR  P 31 2 1      (152) - trigonal
 CLAS 32    (Hermann-Mauguin) - D3  (Schoenflies)
 PRS  hP9
 ANX  AX2
 PARM Atom__No OxStat  Wyck -----X----- -----Y----- -----Z-----  -SOF-
      Si     1  4.000    3a  0.4698(2)   0.          1/3
      O      1 -2.000    6c  0.4151(5)   0.2675(4)   0.2139(1)
 WYCK c a
ÿ
 TF   Atom   U(1,1)  U(2,2)  U(3,3)  U(1,2)  U(1,3)  U(2,3)
      Si 1    0.0049  0.0041  0.0046  0.0021  0.0001  0.0002
                 (3)     (4)     (2)     (2)     (1)     (2)
      O  1    0.0140  0.0102  0.0101  0.0091  0.0029  0.0036
                (10)     (8)     (4)     (8)     (5)     (4)
 RVAL 0.056