COL  ICSD Collection Code 83849
 DATE Recorded Jan 19, 1999
 NAME Silicon oxide - alpha
 MINR Quartz
 FORM Si O2
      = O2 Si
 TITL Synchrotron powder diffraction using imaging plates: crystal 
      structure determination and Rietveld refinement
 REF  Journal of Applied Crystallography
      JACGA 30 (1997) 21-30
 AUT  Norby P
 CELL a=4.913(0) b=4.913(0) c=5.405(0) à=90.0 á=90.0 ç=120.0
      V=113.0 Z=3
 SGR  P 32 2 1 S    (154) - trigonal
 CLAS 32    (Hermann-Mauguin) - D3  (Schoenflies)
 PRS  hP9
 ANX  AX2
 PARM Atom__No OxStat  Wyck -----X----- -----Y----- -----Z-----  -SOF-
      Si     1  4.000    3a  0.4698      0.          0.
      O      1 -2.000    6c  0.4138(3)   0.2651(4)   0.2871(3)
 WYCK c a
 ITF  Si  1   B=2.10(3)
 ITF  O   1   B=2.46(7)
 REM  SNP (synchroton radiation, powder diffraction)
 REM  RVP
 RVAL 0.024