COL ICSD Collection Code 16815 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon oxide dinitride MINR Sinoite - synthetic at 1723 K FORM Si2 N2 O = N2 O Si2 TITL Crystal structure of silicon oxynitride, Si2 N2 O REF Nature (London) NATUA 201 (1964) 1211 AUT Brosset C, IdrestedtÿI CELL a=8.843 b=5.473 c=4.835 à=90.0 á=90.0 ç=90.0 V=234.0 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.176 0.15 0.289 N 1 -3.000 8b 0.218 0.121 0.641 O 1 -2.000 4a 0. 0.214 0.23 WYCK b2 a REM M PDF 18-1171, cp. 34025 TEST Calculated density unusual but tolerable. (Code 23) TEST No R value given in the paper. (Code 51) TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 34025 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Disilicon dinitride oxide MINR Sinoite - synthetic at 1723 K FORM Si2 N2 O = N2 O Si2 TITL Structure of Si2 N2 O REF Acta Chemica Scandinavica (1-27,1973-42,1988) ACSAA 18 (1964) 1879-1886 AUT Idrestedt I, BrossetÿC CELL a=8.843 b=5.473 c=4.835 à=90.0 á=90.0 ç=90.0 V=234.0 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.1763 0.1509 0.2898 N 1 -3.000 8b 0.218 0.121 0.642 O 1 -2.000 4a 0. 0.214 0.23 WYCK b2 a ITF Si 1 B=0.42 ITF N 1 B=1.54 ITF O 1 B=0.35 REM M PDF 18-1171 RVAL 0.075 TEST Calculated density unusual but tolerable. (Code 23) COL ICSD Collection Code 100775 DATE Recorded Dec 31, 1980; updated Jan 19, 1999 NAME Disilicon dinitride oxide MINR Sinoite - synthetic FORM Si2 N2 O = N2 O Si2 TITL Modifications structurales de l'oxynitrure de silicium sous contraintes thermiques REF Materials Research Bulletin MRBUA 15 (1980) 1207-1213 AUT Billy M, LabbeÿJÿC, SelvarajÿA, RoultÿG CELL a=8.869 b=5.493 c=4.849 à=90.0 á=90.0 ç=90.0 V=236.2 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.1808 0.153 0.269 O 1 -2.000 4a 0. 0.2125 0.23 N 1 -3.000 8b 0.2177 0.1264 0.624 WYCK b2 a REM NDP (neutron diffraction from a powder) REM C Time of flight neutron diffraction method REM M PDF 18-1171 REM M Therm. exp. coeff.*10›6/C: a: 1.4(7), b: 4.4(3), c: 4.1(4)) RVAL 0.080 TEST Calculated density unusual but tolerable. (Code 23) TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 100776 DATE Recorded Dec 31, 1980; updated Jan 19, 1999 NAME Disilicon dinitride oxide MINR Sinoite - synthetic FORM Si2 N2 O = N2 O Si2 TITL Modifications structurales de l'oxynitrure de silicium sous contraintes thermiques REF Materials Research Bulletin MRBUA 15 (1980) 1207-1213 AUT Billy M, LabbeÿJÿC, SelvarajÿA, RoultÿG CELL a=8.884 b=5.522 c=4.873 à=90.0 á=90.0 ç=90.0 V=239.1 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.181 0.149 0.271 O 1 -2.000 4a 0. 0.204 0.23 N 1 -3.000 8b 0.2198 0.1267 0.626 WYCK b2 a REM TEM 1473 REM NDP (neutron diffraction from a powder) REM C Time of flight neutron diffraction method RVAL 0.080 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200244 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.866 b=5.486 c=4.845 à=90.0 á=90.0 ç=90.0 V=235.7 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.179 0.149 0.284 N 1 -3.000 8b 0.2177 0.125 0.628 O 1 -2.000 4a 0. 0.212 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM M PDF 18-1171 REM M Compressibility * 10›5/kbar: a: 21(2), b: 34(2), c: 25(2) REM M z(O) fixed for origin RVAL 0.022 TEST Calculated density unusual but tolerable. (Code 23) TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200245 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.859 b=5.476 c=4.832 à=90.0 á=90.0 ç=90.0 V=234.4 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.178 0.145 0.285 N 1 -3.000 8b 0.2163 0.129 0.63 O 1 -2.000 4a 0. 0.211 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 4.4(2) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200246 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.858 b=5.470 c=4.836 à=90.0 á=90.0 ç=90.0 V=234.3 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.18 0.153 0.288 N 1 -3.000 8b 0.2162 0.127 0.633 O 1 -2.000 4a 0. 0.214 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 7.2(1) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200247 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.853 b=5.464 c=4.832 à=90.0 á=90.0 ç=90.0 V=233.7 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.179 0.148 0.295 N 1 -3.000 8b 0.2161 0.125 0.637 O 1 -2.000 4a 0. 0.212 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 10.3(2) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200248 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.837 b=5.457 c=4.829 à=90.0 á=90.0 ç=90.0 V=232.9 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.181 0.146 0.297 N 1 -3.000 8b 0.2154 0.127 0.639 O 1 -2.000 4a 0. 0.215 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 13.5(2) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200249 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.847 b=5.452 c=4.824 à=90.0 á=90.0 ç=90.0 V=232.7 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.179 0.147 0.297 N 1 -3.000 8b 0.2149 0.127 0.64 O 1 -2.000 4a 0. 0.217 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 16.9(2) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200250 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.828 b=5.447 c=4.821 à=90.0 á=90.0 ç=90.0 V=231.8 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.178 0.148 0.292 N 1 -3.000 8b 0.2158 0.124 0.638 O 1 -2.000 4a 0. 0.215 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 20.8(3) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 200251 DATE Recorded Jan 1, 1980; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic at 1623-1723 K FORM Si2 N2 O = N2 O Si2 TITL High-pressure neutron diffraction study of Si2 N2 O REF Journal of Applied Crystallography JACGA 10 (1977) 167-171 AUT Srinivasa S R, CartzÿL, JorgensenÿJÿD, WorltonÿTÿG, BeyerleinÿRÿA, BillyÿM CELL a=8.823 b=5.441 c=4.815 à=90.0 á=90.0 ç=90.0 V=231.1 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.179 0.144 0.286 N 1 -3.000 8b 0.2151 0.124 0.639 O 1 -2.000 4a 0. 0.22 0.23 WYCK b2 a REM NDP (neutron diffraction from a powder) REM PRE 23.2(3) kbar RVAL 0.022 TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 202830 DATE Recorded Jun 19, 1989; updated Jan 19, 1999 NAME Disilicon dinitride oxide MINR Sinoite - synthetic FORM Si2 N2 O = N2 O Si2 TITL L'Oxynitrure de Silicium : Si2 N2 O II. Evolution Structurale et Endommagement par Irradiation aux Neutrons Rapides REF Materials Research Bulletin MRBUA 23 (1988) 1087-1099 AUT Baraton M I, BillyÿM, LabbeÿJÿC, QuintardÿP, RoultÿG CELL a=8.871 b=5.491 c=4.850 à=90.0 á=90.0 ç=90.0 V=236.2 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.18 0.1545 0.2769 O 1 -2.000 4a 0. 0.215 0.23 N 1 -3.000 8b 0.2171 0.1268 0.6283 WYCK b2 a REM NDP (neutron diffraction from a powder) REM M PDF 18-1171 TEST Calculated density unusual but tolerable. (Code 23) TEST No R value given in the paper. (Code 51) TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 202831 DATE Recorded Jun 19, 1989; updated Jan 19, 1999 NAME Disilicon dinitride oxide - irradiated sample MINR Sinoite irradiated - synthetic FORM Si2 N2 O = N2 O Si2 TITL L'Oxynitrure de Silicium : Si2 N2 O II. Evolution Structurale et Endommagement par Irradiation aux Neutrons Rapides REF Materials Research Bulletin MRBUA 23 (1988) 1087-1099 AUT Baraton M I, BillyÿM, LabbeÿJÿC, QuintardÿP, RoultÿG CELL a=8.891 b=5.478 c=4.830 à=90.0 á=90.0 ç=90.0 V=235.3 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- Si 1 4.000 8b 0.1793 0.1512 0.2798 O 1 -2.000 4a 0. 0.218 0.23 N 1 -3.000 8b 0.2159 0.129 0.6362 WYCK b2 a REM NDP (neutron diffraction from a powder) TEST Calculated density unusual but tolerable. (Code 23) TEST No R value given in the paper. (Code 51) TEST At least one temperature factor missing in the paper. (Code 53) COL ICSD Collection Code 66539 DATE Recorded Jan 19, 1994; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic FORM Si2 N2 O = N2 O Si2 TITL Refinement of the structure of Si2 N2 O REF Acta Crystallographica C (39,1983-) ACSCE 47 (1991) 2438-2441 AUT Sjoeberg J, HelgessonÿG, IdrestedtÿI CELL a=8.872 b=5.491 c=4.850 à=90.0 á=90.0 ç=90.0 V=236.3 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- O 1 -2.000 4a 0. 0.2127 0.23 Si 1 4.000 8b 0.1767 0.1511 0.2815 N 1 -3.000 8b 0.2191 0.1228 0.6267 WYCK b2 a ÿ TF Atom U(1,1) U(2,2) U(3,3) U(1,2) U(1,3) U(2,3) O 1 0.0040 0.0090 0.0160 0.0000 0.0000 0.0010 Si 1 0.0040 0.0060 0.0060 0.0000 -0.0010 0.0000 N 1 0.0040 0.0110 0.0060 -0.0010 -0.0030 0.0010 REM TEM 296 REM M PDF 18-1171 RVAL 0.022 TEST Calculated density unusual but tolerable. (Code 23) COL ICSD Collection Code 66540 DATE Recorded Jan 19, 1994; updated Jan 19, 1999 NAME Silicon dinitride oxide MINR Sinoite - synthetic FORM Si2 N2 O = N2 O Si2 TITL Refinement of the structure of Si2 N2 O REF Acta Crystallographica C (39,1983-) ACSCE 47 (1991) 2438-2441 AUT Sjoeberg J, HelgessonÿG, IdrestedtÿI CELL a=8.874 b=5.489 c=4.846 à=90.0 á=90.0 ç=90.0 V=236.1 D=2.77 Z=4 SGR C m c 21 (36) - orthorhombic CLAS mm2 (Hermann-Mauguin) - C2v (Schoenflies) PRS oC20 ANX A2XY2 PARM Atom__No OxStat Wyck ---X--- ---Y--- ---Z--- -SOF- O 1 -2.000 4a 0. 0.2128 0.23 Si 1 4.000 8b 0.1768 0.1512 0.2813 N 1 -3.000 8b 0.2192 0.1227 0.627 WYCK b2 a ÿ TF Atom U(1,1) U(2,2) U(3,3) U(1,2) U(1,3) U(2,3) O 1 0.0010 0.0080 0.0160 0.0000 0.0000 0.0000 Si 1 0.0030 0.0060 0.0060 0.0010 -0.0010 -0.0010 N 1 0.0020 0.0120 0.0050 0.0020 0.0010 0.0010 REM TEM 123 REM M PDF 18-1171 RVAL 0.021 TEST Calculated density unusual but tolerable. (Code 23) TEST At least one temperature factor is implausible or meaningless but agrees with the value given in the paper. (Code 52)