Crystallography Laboratory University of Nijmegen

Primary beam optics

Short spacer for optics

Long spacer for optics

2 degrees soller slit

Single Gobel mirror CU40S-P

Four-bounce monochromator

Automatic divergence slit assembly

Fixed divergence slit assembly

Holder for pinholes and rectangular slits (3x)

0.5 mm pinhole for 435 and 500 mm measuring circle (3x)

1.0 mm pinhole for 435 and 500 mm measuring circle (3x)

0.5 mm pinhole for 600 mm measuring circle (3x)

Fixed divergence slits 0.05 mm, 0.2 mm, 0.6 mm, 1 mm and 2 mm (2x)

Ni filter for Cu-Kbeta radiation (2x)

Height limiting slit: 10 mm height, 2 mm width

Sample stages

Standard sample stage

Sample rotation device

1/4-circle Eulerian Cradle

Alignment tool for open Eulerian Cradle

Vacuum intake 5" (rotable)

Powder stage for Eulerian Cradle

Capillary sample holder

Microscope adapter

Separate alignment microscope

Powder sample holder for rotation device

Powder sample holder for Eulerian Cradle (..x)

Knife-edge collimator

Secundary beam optics

Long spacer for optics

Variable antiscatter slit assembly, type 2

Fixed anti scatter slits

Focussing monochromator for transmission measurements

Ni filter for Cu-Kbeta radiation

Fixed detector slits 0.05 mm, 0.2 mm, 0.6 mm, 1 mm and 2 mm

Absorber assembly

Spacer for detector

Dynamic scintillation detector, NaI

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